Imaging materials structure and bonding using coherent and incoherent electron imaging – Peter Nellist, Department of Materials, The University of Oxford

November 21, 2019 @ 4:00 pm – 5:00 pm
Small Lecture Theatre
Cavendish Laboratory
Stephen Walley

Advances in electron microscope hardware and data processing techniques have dramatically increased imaging sensitivity. Such advances including the development of aberration correctors and high-speed single electron detectors that have enabled the application of techniques including electron ptychography. In this talk I will use examples, including the imaging of bonding effects in hexagonal boron nitride, the determination of catalyst nanoparticle structures, and the imaging of lithium in battery cathodes, to demonstrate the new opportunities.